Liste complète des notices publiques
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- Maintaining a system subject to uncertain technological evolution
- Method for Evaluating an Extended Fault Tree to Analyse the Dependability of Complex Systems:Application to a Satellite-based Railway System
- An ant algorithm for measuring and optimizing the capacity of a railway infrastructure, in Artificial Ants, Monmarche,N, Guinand,F, Siarry,P (Eds), Wiley
- 4th International Seminar on Railway Operations Modelling and Analysis - RailRome2011
- 3rd International Seminar on Railway Operations Modelling and Analysis - RailZurich2009
- Picosecond to sub-picosecond pulse generation from mode-locked VECSELs at 1.55 µm
- Relationship between road infrastructure characteristics and HGV accidents
- Laboratory test to evaluate the effect of contaminants on road skid resistance
- Cross acceptance EMC test setup, test site and test procedure for GSM-R and Broadcasting services technologies
- Towards a resilient railway communication network against electromagnetic attacks
- Analysis tool adapted for the different electromagnetic compatibility issues in the railway domain
- Procédé et système de surveillance de l'état d'une fondation encastrée dans le sol
- Jamming Signal Immunity Tests on GSM-R Communications Compared to EMC Basic Standards
- CARREAUBAT (CaRactérisation Rapide des Enveloppes pour l'AUdit énergétique des BA-Timents) : Dispositif et méthode d'identification de la conductivité et/ou de la capacité thermique d'une paroi
- Main issues and limitations in Power cycling tests for future integrated power converters
- Partial Thermal Impedance Measurement for Die Interconnection Characterization by a Microsecond 'Pulsed Heating Curve Technique'
- Investigation of 1.2 kV Investigation of SiC MOSFETs for Aeronautics Applications
- Power cycling ageing tests at 200°C of SiC assemblies for high temperature electronics
- Top-metal ageing effects on electro-thermal distributions in an IGBT chip under short circuit conditions
- Saturation Current and On-Resistance Correlation during During Repetitive Short-Circuit Conditions on SiC JFET Transistors