On the influence of sample length and measurement noise on the stochastic subspace damage detection technique
ALLAHDADIAN ; DOHLER ; VENTURA ; MEVEL
Type de document
COMMUNICATION AVEC ACTES INTERNATIONAL (ACTI)
Langue
anglais
Auteur
ALLAHDADIAN ; DOHLER ; VENTURA ; MEVEL
Résumé / Abstract
In this paper the effects of measuring noise and number of samples is studied on the stochastic subspace damage detection (SSDD) technique. In this technique, i.e., SSDD, the need of evaluating the eigenstructure of the system is circumvented, making this approach capable of dealing with real-time measurements of structures. In previous studies, the effect of these practical parameters was examined on simulated measurements from a model of a real structure. In this study, these effects are formulated for the expected damage index evaluated from a Chi-square distributed value. Several theorems are proposed and proved. These theorems are used to develop a guideline to serve the user of the SSDD method to face these effects.
